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Reference

ํŠน์ง• ์ถ”์ถœ์„ ์ด์šฉํ•œ ์ด๋ฏธ์ง€ ๋งค์นญ ๊ธฐ์ˆ ์˜ ์ตœ๊ทผ ๋™ํ–ฅ ๋ถ„์„

Machine Learning for High-Speed Corner Detection

Features from Accelerated Segment Test (FAST)์˜ ๊ฒฝ์šฐ ์‹ค์‹œ๊ฐ„ ํŠน์ง•์  ์ถ”์ถœ์„ ๊ณ ๋ คํ•˜์—ฌ ๋งŒ๋“ค์–ด์ง„ ์•Œ๊ณ ๋ฆฌ์ฆ˜์œผ๋กœ ์ฃผ๋ณ€ ํ”ฝ์…€๊ณผ ์ค‘์‹ฌ ํ”ฝ์…€์˜ ๋ฐ๊ธฐ๋ฅผ ๋น„๊ตํ•˜์—ฌ ์ค‘์‹ฌ ํ”ฝ์…€์˜ ํŠน์ง•์  ์—ฌ๋ถ€๋ฅผ ํŒ๋‹จํ•ฉ๋‹ˆ๋‹ค.

ํŠน์ง•์ ์€ ์ฃผ๋ณ€ ํ”ฝ์…€์˜ ๋ฐ๊ธฐ ๊ฐ’๊ณผ ์ค‘์‹ฌ ํ”ฝ์…€์˜ ๋ฐ๊ธฐ ๊ฐ’๊ณผ์˜ ์ฐจ์ด๊ฐ€ ํŠน์ • ์ž„๊ณ„๊ฐ’๋ณด๋‹ค ํฌ๊ฑฐ๋‚˜ ์ž‘์€ ๊ฒฝ์šฐ๋กœ ์ •์˜ํ•ฉ๋‹ˆ๋‹ค.

ํŠน์ง•์  ํŒ๋‹จ ์ดํ›„ ํŠน์ง•์ ์œผ๋กœ ํŒ๋‹จ๋œ ํ”ฝ์…€์„ ์ค‘์‹ฌ์œผ๋กœ 16๊ฐœ์˜ ์ด์›ƒ ํ”ฝ์…€์„ ๊ฒ€์‚ฌํ•˜์—ฌ ํŠน์ง•์ ์˜ ์‹ ๋ขฐ๋„๋ฅผ ์ธก์ •ํ•ฉ๋‹ˆ๋‹ค.

์•„๋ž˜ ๊ทธ๋ฆผ์€ FAST์˜ 16๊ฐœ ์ฃผ๋ณ€ ํ”ฝ์…€์˜ ์œ„์น˜๋ฅผ ๋ณด์—ฌ์ค๋‹ˆ๋‹ค.

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